Mitarbeiter von Q-Tech Roding arbeiten vor dem Computertomographen ZEISS METROTOM 1500

Technologies

CT
KMS
3D Scan
“Our measurement experts assist your quality control and detect defects even before they occur.”

Precisely

Defect analysis allows us to determine the effects of long-term stress on components or tools. Our state-of-the-art testing and measurement technology enables the non-destructive detection of shape changes, weak points, functional limitations, and damage, even internally.

The results are precisely presented and evaluated using high-resolution 3D or 2D displays. Furthermore, irregularities can be visualized as color-coded deviation displays, allowing for valid statements about the usability of the respective component.

Our Expertise at a Glance

Services

  • Detection of internal & external damage
  • Comprehensive imaging of internal inconsistencies with exceptional detail
  • Non-destructive Measuring & Analyzing
  • High-resolution 3D or 2D display
  • Measurement of components up to a maximum measuring volume of ø 615 x 870 mm

Benefits

  • Detect internal defects
  • in-house analyses possible with a free viewer
  • no alteration of the test object 
  • Avoid costly component sectioning
  • Non-contact analysis of transparent, flexible, and soft components
  • Non-destructive detection of product and material flaws

Our Computed Tomographs

ZEISS METROTOM 800 im Messlabor von Q-Tech

ZEISS METROTOM 800

  • X-ray tube: 130 kV
  • Measurement accuracy: MPE SD(TS): 2.9+L/100 µm
  • Resolution: 1536 x 1920 pixels (2K detector)
  • Max. measuring volume: [mm] Ø 275 x 360
  • Accreditation: yes
ZEISS METROTOM 1500 im Messlabor von Q-Tech

ZEISS METROTOM 1500

  • X-ray tube: 225 kV
  • Measurement accuracy: MPE SD(TS): 4.5+L/50 µm
  • Resolution: 3072 x 3072 pixels (3K detector)
  • Max. measuring volume: [mm] Ø 615 x 870
  • Accreditation: yes