
Measurement uncertainty is one of the central concepts in industrial metrology – and at the same time one of the most frequently misunderstood. In this high-level expert lecture at the Q-Tech Days 2025, Dr. Dietrich Imkamp (ZEISS IQS) explains what lies behind terms like MPE, Capability, and Suitability.
This expert lecture is aimed at quality managers, metrology engineers, production managers, and anyone who wants to make informed decisions based on reliable measurement results. Dr. Imkamp makes complex metrological concepts understandable and practical.
The Q-Tech Days are our annual expert forum for industrial metrology. High-caliber speakers, practical expert lectures, and direct exchange with industry experts – all in one place.